Beam Profiler
MKS Ophir, Light & MeasurementRequest Info
NORTH LOGAN, Utah, Aug. 16, 2012 — Photon, a Newport Corp. brand, has introduced the NanoScan v2, the latest version of its scanning-slit beam profiler. The NIST-calibrated laser beam profiler uses moving slits to measure beam sizes from microns to centimeters at beam powers from microwatts to kilowatts, with little to no attenuation. The new version adds an enhanced graphical user interface with support for the Microsoft Windows ribbon toolbar. Dockable and floatable windows plus concealable ribbon toolbars allow users to make the most of any size display, from small laptops to large multimonitor desktops.
The system is suitable for profiling the CO2 beams used in materials processing. The scanning-slit technology can measure most high-power beams without the need for complicated attenuation schemes.
NanoScan v2 supports the 64- and 32-bit versions of Windows 7, enhancing system configuration options and increasing processing speed. Detector options (silicon, germanium and pyroelectric) enable measurement at wavelengths from the ultraviolet to the far-infrared. The profiler can simultaneously measure multiple beams and offers an optional power meter for scan heads with silicon and germanium detectors.
https://www.ophiropt.com/photonics
https://www.photonics.com/Buyers_Guide/MKS_Ophir_Light_Measurement/c10765
Photonics.com
Aug 2012