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Beam Profiling System

MKS Instruments Inc.Request Info
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The Ophir® BeamWatch® Plus noncontact beam profiling system from MKS Instruments Inc. is designed for measuring focus shift, focus spot size, and position of high-power industrial lasers operating in the VIS and NIR ranges.

The industrial beam profiler quickly and accurately measures laser parameters without requiring contact with the laser beam. Continuous measurements are taken using Rayleigh scatter, providing instant readings of focus spot size, beam position, and the full beam caustic, as well as dynamic measurements of focal plane location during process startup. Measurements of the beam are taken at frequent intervals without having to shut down the process or remove extensive tooling and fixtures. It is designed for high-power YAG, fiber, and diode lasers used in industrial material processing, automotive, and energy applications.

Photonics Spectra
Sep 2023
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