Benchtop Spectrophotometer
X-RiteRequest Info
GRAND RAPIDS, Mich., June 23, 2025 — 
The CiF3200 from X-Rite is an imaging benchtop spectrophotometer designed for color measurement of small, odd-shaped, multi-colored, and highly reflective items. The CiF3200 has virtual apertures ranging from 2-12 mm, on-screen targeting for precise sample alignment, and automatic multicolor extraction. The product offers simultaneous SPIN/SPEX capability, and enables brilliance measurement for quality control on metals and materials that may exhibit visual variation due to surface finishing and metallic reflection. The CiF3200 can be used in industries such as consumer electronics and plastic components.
https://www.xrite.com
/Buyers-Guide/X-Rite/c16234
Published: June 2025
From the Photonics Marketplace
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