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CMM Compact Probes

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COBHAM, England, June 24, 2016 — CMM Compact ProbesHexagon Manufacturing Intelligence has announced the HP-S-X1 series of compact probes for 3D coordinate measuring machine tactile scanning.

The HP-S-X1 product line features a new bearing system for better joint repeatability and accepts longer horizontal styli for improved flexibility. Operators do not need to change modules to tackle different measurement tasks, as the probes support stylus lengths of up to 225 mm.

The probes feature small external dimensions and longer stylus lengths to measure surface features of complex parts, as well as bores or holes deep inside a workpiece, saving time during the inspection process. Magnetic interfaces allow for automated stylus changes on the coordinate measuring machine. The probe range supports all standard inspection modes including dynamic single-point contact measurement, self-centering measurement and continuous high-speed scanning for quick and precise data acquisition of various surface contours.



Published: June 2016
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Productscompact measuring machine probesHP-S-X1Hexagon Manufacturing IntelligenceEuropeCMMmanufacturingindustrialinspectionTest & Measurementmetrology

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