Search Menu
Photonics Media Photonics Marketplace Photonics Spectra BioPhotonics Vision Spectra Photonics Showcase Photonics ProdSpec Photonics Handbook

Cold Field Emission Gun

JEOL USA Inc.Request Info
Facebook Twitter LinkedIn Email
PEABODY, Mass., Aug. 5, 2010 — A new cold field emission gun (FEG) from JEOL USA Inc. enhances the ultrahigh atomic-level resolution of the company’s JEM-ARM200F aberration-corrected scanning/scanning transmission electron microscope.

Now outfitted with the optional and field-retrofittable cold FEG, the JEM-ARM200F’s ultrahigh imaging resolution is guaranteed at 78 pm with an energy resolution of 0.3 eV. The higher brightness and smaller source size of the cold FEG produce a smaller, sharper electron probe with a larger probe current, resulting in enhanced atom-by-atom imaging and chemical analysis.

The narrow energy spread of the electrons emitted from the cold FEG enables atomic resolution analysis of electron energy-loss-spectroscopy fine structures, which can be used to determine such things as electronic properties. Ultrahigh vacuum near the electron source assures high stability of the electron probe current, while high electrical system stability of 10-7 maintains the very narrow energy spread of the electron probe.

The addition of a cold FEG to the ARM family adds another dimension to the company’s capability for atomic scale imaging and characterization. This enhancement enables performance of subangstrom imaging and atomic column chemistry with accuracy, speed and ease.

The ARM200F electron column integrates the cold FEG, scanning/scanning transmission electron microscope and Cs correction in an ultrastable design. Good shielding safeguards the ultrahigh-power optics from airflow, vibration, acoustical, magnetic, electronic and thermal interferences.
Aug 2010
* First Name:
* Last Name:
* Email Address:
* Company:
* Country:

When you click "Send Request", we will record and send your personal contact information to JEOL USA Inc. by email so they may respond directly. You also agree that Photonics Media may contact you with information related to this inquiry, and that you have read and accept our Privacy Policy and Terms and Conditions of Use.

Register or login to auto-populate this form:
Login Register
* Required

aberration-correctedAmericasatomic-level resolutionBasic Sciencecold field emission gunCs correctionEELSenergy-loss-spectroscopyFEGfield-retrofittableimagingJEM-ARM200FJEOLMicroscopyopticsProductsS/TEMscanning electron microscopescanning transmission electron microscopesubangstromTest & Measurement

back to top
Facebook Twitter Instagram LinkedIn YouTube RSS
©2023 Photonics Media, 100 West St., Pittsfield, MA, 01201 USA, [email protected]

Photonics Media, Laurin Publishing
x We deliver – right to your inbox. Subscribe FREE to our newsletters.
We use cookies to improve user experience and analyze our website traffic as stated in our Privacy Policy. By using this website, you agree to the use of cookies unless you have disabled them.