ContourX-500 Optical Profilometer
Bruker Nano SurfacesRequest Info
SPIE Photonics West 2021 Digital Forum
As the world’s most comprehensive automated benchtop system for fast, non-contact 3D surface metrology, ContourX-500 boasts unmatched Z-axis resolution and accuracy. The profiler delivers the many advantages of Bruker’s white light interferometry floor-standing models in a much smaller footprint that is easily customized for the widest range of applications, from QA/QC metrology of precision machined surfaces and semiconductor processes to R&D characterization for ophthalmics and MEMS devices.
https://www.bruker.com/nano
/Buyers_Guide/Bruker_Nano_Surfaces/c19385
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