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ContourX-500 Profilometer

Bruker Nano SurfacesRequest Info
 
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ContourX-500 Profilometer As the world’s mostAs the world’s most comprehensive automated benchtop system for fast, noncontact 3D surface metrology, the gage-capable ContourX-500 boasts unmatched Z-axis resolution and accuracy. This white-light interferometry (WLI) profiler is easily customized for the widest range of complex applications, from QA/QC metrology of precision machined surfaces and semiconductor processes to R&D characterization for ophthalmic and MEMS devices.


Published: May 2021
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