ContourX-500 Profilometer

Bruker Nano SurfacesRequest Info
Facebook X LinkedIn Email
ContourX-500 Profilometer As the world’s mostAs the world’s most comprehensive automated benchtop system for fast, noncontact 3D surface metrology, the gage-capable ContourX-500 boasts unmatched Z-axis resolution and accuracy. This white-light interferometry (WLI) profiler is easily customized for the widest range of complex applications, from QA/QC metrology of precision machined surfaces and semiconductor processes to R&D characterization for ophthalmic and MEMS devices.

Published: May 2021
* First Name:
* Last Name:
* Email Address:
* Company:
* Country:

When you click "Send Request", we will record and send your personal contact information to Bruker Nano Surfaces by email so they may respond directly. You also agree that Photonics Media may contact you with information related to this inquiry, and that you have read and accept our Privacy Policy and Terms and Conditions of Use.

Register or login to auto-populate this form:
Login Register
* Required

Photonics Marketplace
Looking for MEMS? There are 23 companies listed in the Photonics Buyers' Guide.
Browse Cameras & Imaging, Lasers, Optical Components, Test & Measurement, and more.
Test & Measurement

We use cookies to improve user experience and analyze our website traffic as stated in our Privacy Policy. By using this website, you agree to the use of cookies unless you have disabled them.