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DIP System

HORIBA ScientificRequest Info
 
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DIP SystemHoriba Scientific has announced a differential interferometry profiling (DIP) system for depth profiling in glow discharge optical emission spectrometry (GD-OES).

GD-OES is a technique for fast, multi-elemental depth profiling of conductive and nonconductive materials. GD-OES relies on plasma for the sputtering of a representative area of the investigated specimen and on a high resolution spectrometer for the simultaneous measurement of all elements of interest.

DIP provides real-time layer thickness, crater depth and sputter rate without calibration. The new instrument capability offers in situ direct measurement. The feature can also be retrofitted on existing GD-OES instruments.

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Photonics Spectra
Sep 2016
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ProductsDifferential Interferometry profilingDIPHoriba ScientificAmericasspectroscopyindustrialimaginginspectionTest & MeasurementGD-OES

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