Search Menu
Photonics Media Photonics Marketplace Photonics Spectra BioPhotonics EuroPhotonics Vision Spectra Photonics Showcase Photonics ProdSpec Photonics Handbook

DIP System

HORIBA ScientificRequest Info
Facebook Twitter LinkedIn Email Comments
DIP SystemHoriba Scientific has announced a differential interferometry profiling (DIP) system for depth profiling in glow discharge optical emission spectrometry (GD-OES).

GD-OES is a technique for fast, multi-elemental depth profiling of conductive and nonconductive materials. GD-OES relies on plasma for the sputtering of a representative area of the investigated specimen and on a high resolution spectrometer for the simultaneous measurement of all elements of interest.

DIP provides real-time layer thickness, crater depth and sputter rate without calibration. The new instrument capability offers in situ direct measurement. The feature can also be retrofitted on existing GD-OES instruments.

Photonics Spectra
Sep 2016

* Message:
(requirements, questions for supplier)
Your contact information
* First Name:
* Last Name:
* Email Address:
* Company:
Address 2:
Postal Code:
* Country:
Phone #:
Fax #:

Register or login to auto-populate this form:
Login Register
* Required

When you click "Send Request", we will record and send your personal contact information to HORIBA Scientific by email so they may respond directly. You also agree that Photonics Media may contact you with information related to this inquiry, and that you have read and accept our Privacy Policy and Terms and Conditions of Use.
ProductsDifferential Interferometry profilingDIPHoriba ScientificAmericasspectroscopyindustrialimaginginspectionTest & MeasurementGD-OES

view all
back to top
Facebook Twitter Instagram LinkedIn YouTube RSS
©2021 Photonics Media, 100 West St., Pittsfield, MA, 01201 USA, [email protected]

Photonics Media, Laurin Publishing
x Subscribe to Photonics Spectra magazine - FREE!
We use cookies to improve user experience and analyze our website traffic as stated in our Privacy Policy. By using this website, you agree to the use of cookies unless you have disabled them.