Search
Menu
PROMOTED
CONTENT
Promoted content

Deep Learning Inspection Libraries

Euresys SARequest Info
 
Facebook X LinkedIn Email
Euresys Deep Learning Inspection LibrariesEuresys Deep Learning Bundle has been tailored, parametrized, and optimized for analyzing images, particularly for machine vision applications.

The Convolutional Neural Network-based inspection libraries, allow the user to perform classification (EasyClassify), supervised or unsupervised segmentation (EasySegment), and object localization (EasyLocate).

Deep Learning Bundle has a simple API and the user can benefit from the power of deep learning technologies with only a few lines of code.

Try before you buy: Deep Learning Bundle comes with the free Deep Learning Studio application allowing data set creation, training, and evaluation.

It supports data augmentation and masks and is compatible with CPU and GPU processing. And now also available for ARM devices for embedded applications.


REQUEST INFO ABOUT THIS PRODUCT
* First Name:
* Last Name:
* Email Address:
* Company:
* Country:
Message:


When you click "Send Request", we will record and send your personal contact information to Euresys SA by email so they may respond directly. You also agree that Photonics Media may contact you with information related to this inquiry, and that you have read and accept our Privacy Policy and Terms and Conditions of Use.

Register or login to auto-populate this form:
Login Register
* Required

ProductsEuresysmachine visiondeep learningOpen eVisionEasyClassifyclassificationEasySegmentsegmentationEasyLocatelocalization

We use cookies to improve user experience and analyze our website traffic as stated in our Privacy Policy. By using this website, you agree to the use of cookies unless you have disabled them.