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Deep Learning Inspection Libraries

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Euresys Deep Learning Inspection LibrariesEuresys Deep Learning Bundle has been tailored, parametrized, and optimized for analyzing images, particularly for machine vision applications.

The Convolutional Neural Network-based inspection libraries, allow the user to perform classification (EasyClassify), supervised or unsupervised segmentation (EasySegment), and object localization (EasyLocate).

Deep Learning Bundle has a simple API and the user can benefit from the power of deep learning technologies with only a few lines of code.

Try before you buy: Deep Learning Bundle comes with the free Deep Learning Studio application allowing data set creation, training, and evaluation.

It supports data augmentation and masks and is compatible with CPU and GPU processing. And now also available for ARM devices for embedded applications.

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ProductsEuresysmachine visiondeep learningOpen eVisionEasyClassifyclassificationEasySegmentsegmentationEasyLocatelocalization

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