Search Menu
Photonics Media Photonics Buyers' Guide Photonics Spectra BioPhotonics EuroPhotonics Vision Spectra Photonics Showcase Photonics ProdSpec Photonics Handbook
More News

Dimension Edge PSS AFM

Bruker Nano SurfacesRequest Info
Facebook Twitter LinkedIn Email Comments
SANTA BARBARA, Calif., Aug. 16, 2011 — Bruker Corp. has launched the Dimension Edge PSS atomic force microscope (AFM), a production-environment instrument tailored for patterned sapphire substrate (PSS) metrology in high-brightness LED manufacturing.

The easy-to-operate AFM delivers resolution beyond that produced by traditional optical techniques and provides precise 3-D profile information to control advanced PSS processes. The system performs automated measurement, data collection and analysis, and report generation on 2- to 6-in. wafers for production metrology applications. It also offers capabilities essential for LED research and development. It is supplied with the proprietary AutoMET software package, which improves manufacturing productivity by fully automating AFM data collection and analysis report generation to provide pass/fail output.

The system is a turnkey production metrology instrument for patterned sapphire substrate manufacturers. The software can be configured to measure between one and nine wafers at multiple points per wafer, including automated data analysis and reporting, providing measurement details to the engineer and a pass/fail indicator to the operator.
Aug 2011

* Message:
(requirements, questions for supplier)
Your contact information
* First Name:
* Last Name:
* Email Address:
* Company:
Address 2:
Postal Code:
* Country:
Phone #:
Fax #:

Register or login to auto-populate this form:
Login Register
* Required

When you click "Send Request", we will record and send your personal contact information to Bruker Nano Surfaces by email so they may respond directly. You also agree that Photonics Media may contact you with information related to this inquiry, and that you have read and accept our Privacy Policy and Terms and Conditions of Use.
Test & Measurement
AFM 3-D profile informationmetrologyWafersLEDsAFM LED manufacturingAmericasAutoMET softwareBasic ScienceBrukerCaliforniaDimension Edge PSS atomic force microscopeindustrialLED research and developmentlight sourcesMicroscopyopticspatterned sapphire substrate metrologyProductsTest & Measurementturnkey production metrology AFM

back to top
Facebook Twitter Instagram LinkedIn YouTube RSS
©2020 Photonics Media, 100 West St., Pittsfield, MA, 01201 USA, [email protected]

Photonics Media, Laurin Publishing
x We deliver – right to your inbox. Subscribe FREE to our newsletters.
Are you interested in this product?
When you click "Send Request", we will send the contact details you supply to Bruker Nano Surfaces so they may respond to your inquiry directly.

Email Address:
Stop showing me this for the remainder of my visit
We use cookies to improve user experience and analyze our website traffic as stated in our Privacy Policy. By using this website, you agree to the use of cookies unless you have disabled them.