Search Menu
Photonics Media Photonics Buyers' Guide Photonics Spectra BioPhotonics EuroPhotonics Vision Spectra Photonics Showcase Photonics ProdSpec Photonics Handbook

Dimensional Measurement

STILRequest Info
Facebook Twitter LinkedIn Email Comments
STIL_SA.jpgStil SA’s Stil Duo sensor provides two optical principles for simultaneous dimensional measurement: the “confocal chromatic” and the “white light spectral interferometry.” With a wide range of optical pens, the former’s measurement dynamics range from 20 μm to 25 mm and can be performed on any type of material, including opaque, transparent, reflective and diffusing. The spectral interferometry process allows access to subnanometric resolutions for topography measurements that can be performed within a scale of up to 150 μm. The sensor is insensitive to vibrations.

Oct 2009

* Message:
(requirements, questions for supplier)
Your contact information
* First Name:
* Last Name:
* Email Address:
* Company:
Address 2:
Postal Code:
* Country:
Phone #:
Fax #:

Register or login to auto-populate this form:
Login Register
* Required

When you click "Send Request", we will record and send your personal contact information to STIL by email so they may respond directly. You also agree that Photonics Media may contact you with information related to this inquiry, and that you have read and accept our Privacy Policy and Terms and Conditions of Use.
confocal chromaticdiffusingdimensional measurementEuropeopaqueoptical pensoptical principlesopticsProduct PreviewreflectivesensorSensors & Detectorsspectral interferometryStil DuoSTIL SAsubnanometricTest & Measurementtopographytransparentwhite light

back to top
Facebook Twitter Instagram LinkedIn YouTube RSS
©2020 Photonics Media, 100 West St., Pittsfield, MA, 01201 USA, [email protected]

Photonics Media, Laurin Publishing
x Subscribe to EuroPhotonics magazine - FREE!
Are you interested in this product?
When you click "Send Request", we will send the contact details you supply to STIL so they may respond to your inquiry directly.

Email Address:
Stop showing me this for the remainder of my visit
We use cookies to improve user experience and analyze our website traffic as stated in our Privacy Policy. By using this website, you agree to the use of cookies unless you have disabled them.