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Electron Microscopy Services

Covalent Metrology Services Inc.Request Info
 
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SUNNYVALE, Calif., Sept. 10, 2020 — Electron Microscopy ServicesCovalent Metrology has announced electron microscopy services with the introduction of two dual-beam focused ion beam scanning electron (FIB-SEM) microscopes.

The Thermo Scientific Helios 5 provides high resolution for enhanced measurement and visualization with specialized features particularly beneficial to clients’ characterizing devices or complex nanostructures. The Scios has comparable ultra-high resolution with adaptability to accommodate challenging materials including samples previously untenable on an electron microscope. Its potent charge neutralization system enables full dual-beam manipulation and imaging of magnetic samples, and enables imaging at pressures well above vacuum. Both are equipped with scanning transmission electron microscopy detectors and energy dispersive spectrometers for accurate element detection.

Applications include geological, biotech, and biomedical research, as well as metallurgical testing in the automotive, aerospace, construction, and manufacturing industries.


Photonics.com
Sep 2020
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ProductsCovalent Metrologyelectron microscopy servicesMicroscopyBiophotonicslife sciencesmedicalaerospaceautomotiveindustrialAmericas

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