Close

Search

Search Menu
Photonics Media Photonics Buyers' Guide Photonics EDU Photonics Spectra BioPhotonics EuroPhotonics Industrial Photonics Photonics Showcase Photonics ProdSpec Photonics Handbook
More News
share
Email Facebook Twitter Google+ LinkedIn

Fast Scanning

Photonics Spectra
Oct 2011
Bruker Nano SurfacesRequest Info
 
Bruker Corp. has announced fast scanning capabilities for the MultiMode 8 atomic force microscope (AFM). The system's new Scan-Asyst-HR feature provides a direct sixfold increase in imaging rate for improved research productivity. This development leverages the company's exclusive ScanAsyst imaging mode, which provides ease of use. It also provides fast scanning capabilities on the Dimension FastScan. Adding ScanAsyst-HR makes the high resolution and performance of the microscopes available at scan rates six times faster than is conventional and enables up to 20 times faster survey scanning. ScanAsyst-HR on the MultiMode 8 makes faster AFM imaging accessible to a broader segment of the AFM research market and provides an upgrade path for existing users of older MultiMode AFMs.


REQUEST INFO ABOUT THIS PRODUCT

* Message:
(requirements, questions for supplier)
Your contact information
* First Name:
* Last Name:
* Email Address:
* Company:
Address:
Address 2:
City:
State/Province:
Postal Code:
* Country:
Phone #:
Fax #:

Register or login to auto-populate this form:
Login Register
* Required

When you click "Send Request", we will record and send your personal contact information to Bruker Nano Surfaces by email so they may respond directly. You also agree that Photonics Media may contact you with information related to this inquiry, and that you have read and accept our Privacy Policy and Terms and Conditions of Use.
MORE FROM PHOTONICS MEDIA
Americasatomic force microscopesBasic ScienceBrukerCaliforniaDimension FastScan AFMenergy generation research applicationsenergy storage research applicationsfast scanning for MultiMode 8 AFMimagingMicroscopyNew ProductsopticsPeakForce QNM modePeakForce TUNA modequantitative nanoelectrical characterizationquantitative nanomechanical characterizationScanAsyst-HR imaging mode

Terms & Conditions Privacy Policy About Us Contact Us
back to top
Facebook Twitter Instagram LinkedIn YouTube RSS
©2018 Photonics Media, 100 West St., Pittsfield, MA, 01201 USA, info@photonics.com

Photonics Media, Laurin Publishing
x Subscribe to Photonics Spectra magazine - FREE!
X
Are you interested in this product?
When you click "Send Request", we will send the contact details you supply to Bruker Nano Surfaces so they may respond to your inquiry directly.

Email Address:
Name:
Company:
Stop showing me this for the remainder of my visit
We use cookies to improve user experience and analyze our website traffic as stated in our Privacy Policy. By using this website, you agree to the use of cookies unless you have disabled them.