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Fast Scanning

Bruker Nano SurfacesRequest Info
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Bruker Corp. has announced fast scanning capabilities for the MultiMode 8 atomic force microscope (AFM). The system's new Scan-Asyst-HR feature provides a direct sixfold increase in imaging rate for improved research productivity. This development leverages the company's exclusive ScanAsyst imaging mode, which provides ease of use. It also provides fast scanning capabilities on the Dimension FastScan. Adding ScanAsyst-HR makes the high resolution and performance of the microscopes available at scan rates six times faster than is conventional and enables up to 20 times faster survey scanning. ScanAsyst-HR on the MultiMode 8 makes faster AFM imaging accessible to a broader segment of the AFM research market and provides an upgrade path for existing users of older MultiMode AFMs.

Photonics Spectra
Oct 2011

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Americasatomic force microscopesBasic ScienceBrukerCaliforniaDimension FastScan AFMenergy generation research applicationsenergy storage research applicationsfast scanning for MultiMode 8 AFMimagingMicroscopyNew ProductsopticsPeakForce QNM modePeakForce TUNA modequantitative nanoelectrical characterizationquantitative nanomechanical characterizationScanAsyst-HR imaging mode

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