Search
Menu

Fault Localization and Transistor Characterization Tool

Thermo Fisher Scientific Inc.Request Info
 
Facebook X LinkedIn Email
FORTH WORTH, Texas, Jan. 10, 2017 — The nProber III fault localization and transistor characterization tool from Thermo Fisher Scientific Inc. provides process development and failure analysis down to the 7-nm technology node.

The nProber III allows failure analysis engineers to find and characterize individual devices preparatory to extracting thin sectional samples for physical failure analysis in transmission electron microscopy.

The nProber III doubles the resolution and probe stability over its predecessor.


Published: January 2017
REQUEST INFO ABOUT THIS PRODUCT
* First Name:
* Last Name:
* Email Address:
* Company:
* Country:
Message:


When you click "Send Request", we will record and send your personal contact information to Thermo Fisher Scientific Inc. by email so they may respond directly. You also agree that Photonics Media may contact you with information related to this inquiry, and that you have read and accept our Privacy Policy and Terms and Conditions of Use.

Register or login to auto-populate this form:
Login Register
* Required

ProductsnProber IIIfault localization and transistor characterization toolThermo Fisher ScientificAmericasMicroscopy

We use cookies to improve user experience and analyze our website traffic as stated in our Privacy Policy. By using this website, you agree to the use of cookies unless you have disabled them.