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Fault Localization and Transistor Characterization Tool
Jan 2017
Thermo Fisher Scientific Inc.
FORTH WORTH, Texas, Jan. 10, 2017 — The nProber III fault localization and transistor characterization tool from Thermo Fisher Scientific Inc. provides process development and failure analysis down to the 7-nm technology node.

The nProber III allows failure analysis engineers to find and characterize individual devices preparatory to extracting thin sectional samples for physical failure analysis in transmission electron microscopy.

The nProber III doubles the resolution and probe stability over its predecessor.

Thermo Fisher Scientific
ProductsnProber IIIfault localization and transistor characterization toolThermo Fisher ScientificAmericasMicroscopy

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