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Field-Emission Scanning Electron Microscope

JEOL USA Inc.Request Info
 
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PEABODY, Mass., March 16, 2020 — Field-Emission Scanning Electron MicroscopeThe F100 FE-SEM field-emission scanning electron microscope from JEOL USA Inc. combines electron optics with fully embedded energy-dispersive spectroscopy (ADS) microanalysis and artificial intelligence (AI) algorithms to achieve ease of use and a streamlined workflow.

NeoEngine employs AI to optimizing electron beam setup and tuning. It corrects electron trajectories and automatically aligns the beam in real time while automatically correcting focus, brightness/contrast, and astigmatism. EDS with live analysis provides real-time imaging and elemental analysis, allowing the user to select the area, mapping, line, or another type of analysis directly on the observation screen to begin automatic live display of the elements in the specified location. The Zeromag navigation function seamlessly transitions between optical imaging to nanoscale investigation with high-powered microscopy optics.


Photonics.com
Mar 2020
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ProductsF100 FE-SEMfield-emission scanning electron microscopeMicroscopymachine visionimagingnanoAmericas

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