Field Emission Scanning Electron Microscope
JEOL USA Inc.Request Info
PEABODY, Mass., Sept. 18, 2020 — 
The JSM-IT700HR InTouchScope field emission scanning electronic microscope from JEOL is a compact system that offers ultra-high resolution and versatile analytical capabilities.
The JSM-IT700HR InTouchScope FE SEM is equipped with a large specimen chamber and both high- and low-vacuum modes for managing a wide variety of specimen types in their native state. It can be outfitted with a fully-embedded energy dispersive x-ray spectroscopy microanalysis system providing live analysis during image observation. An electron gun with a spatial resolution of 1 nm and the ability to deliver >300 nA of beam current make this microscope ideally suited for imaging and analysis of nanostructures, electronic products, metals, soft materials, food, and biology.
A user-friendly software interface significantly simplifies observation. Expanded functionality includes automated montage, movie capture of the live image, and compatibility with Python scripting, live web viewing, and remote control.
https://www.jeolusa.com
https://www.photonics.com/Buyers_Guide/JEOL_USA_Inc/c7365
Photonics.com
Sep 2020