Field Emission Scanning Electron Microscope

JEOL USA Inc.Request Info

PEABODY, Mass., Sept. 18, 2020 —

Field Emission Scanning Electron Microscope

The JSM-IT700HR InTouchScope field emission scanning electronic microscope from JEOL is a compact system that offers ultra-high resolution and versatile analytical capabilities.

The JSM-IT700HR InTouchScope FE SEM is equipped with a large specimen chamber and both high- and low-vacuum modes for managing a wide variety of specimen types in their native state. It can be outfitted with a fully-embedded energy dispersive x-ray spectroscopy microanalysis system providing live analysis during image observation. An electron gun with a spatial resolution of 1 nm and the ability to deliver >300 nA of beam current make this microscope ideally suited for imaging and analysis of nanostructures, electronic products, metals, soft materials, food, and biology.

A user-friendly software interface significantly simplifies observation. Expanded functionality includes automated montage, movie capture of the live image, and compatibility with Python scripting, live web viewing, and remote control.

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Photonics.com
Sep 2020

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Field Emission Scanning Electron Microscope