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Field Emission Scanning Electron Microscope

JEOL USA Inc.Request Info
 
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PEABODY, Mass., Sept. 18, 2020 — Field Emission Scanning Electron MicroscopeThe JSM-IT700HR InTouchScope field emission scanning electronic microscope from JEOL is a compact system that offers ultra-high resolution and versatile analytical capabilities.

The JSM-IT700HR InTouchScope FE SEM is equipped with a large specimen chamber and both high- and low-vacuum modes for managing a wide variety of specimen types in their native state. It can be outfitted with a fully-embedded energy dispersive x-ray spectroscopy microanalysis system providing live analysis during image observation. An electron gun with a spatial resolution of 1 nm and the ability to deliver >300 nA of beam current make this microscope ideally suited for imaging and analysis of nanostructures, electronic products, metals, soft materials, food, and biology.

A user-friendly software interface significantly simplifies observation. Expanded functionality includes automated montage, movie capture of the live image, and compatibility with Python scripting, live web viewing, and remote control.


Photonics.com
Sep 2020
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ProductsJSM-ITT700HRInTouchScopefield emission scanning electron microscopeJEOLMicroscopynanoimagingmaterialsBiophotonicsmedicineAmericas

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