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Film Thickness/Index Measurement

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The Model 2010/M prism coupler accurately measures thickness (±0.5%) and index (±0.0002) of thin films, index and birefringence of bulk materials, and mode indices, index gradients and loss for optical waveguides. Measurable materials include dielectrics, polymers, some semiconductors, SPR layers and liquids. Flexible samples are also measurable. Wavelengths from 405 to 1550 nm and measurement of dn/dT are also available.

Photonics Showcase
Sep 2010

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birefringencebulk materialsdielectricsEuroPhotonics Product SpotlightFeatured Productsfilm thicknessflexible sampleINDEXindex gradientindex measurementliquidsMetriconMetricon Corporationmode indicesModel 2010/Moptical waveguidePhotonics Showcasepolymersprism couplerProduct ShowcasesemiconductorsSPR layerTest & Measurementthin films

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