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Fully Automated IR Microscope

Seiwa Optical America Inc.Request Info
 
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Fully automated IR microscope This new, fully automated IR Microscope is combined with motorized Z focus and automated X and Y stage. These new features allow you to take stitching images with different extended exposure, field, and focus. Also, this new system allows you to take topography imaging for 3D views and measurements. Seiwa Optical's IR-2200 microscope allows the user to inspect sub-surface images including MEMS devices, 3D stacks, incoming wafers, photovoltaic and wafer-level CSP's.

The IR-2200 system integrates the infrared tabletop microscope system with software. Camera options include near infrared (NIR) and Shortwave Infrared (SWIR) cameras. Objective lens options include Seiwa Optical's M Plan APO series (spectral sensitivity range from 400 nm-1100 nm), Seiwa Optical's PE IR series (spectral sensitivity range for near infrared wavelengths up to 1600 nm), and PE IR 2000 HR series (color corrected from 1000 nm - 2000 nm wavelength).

Features include high precision measurements, image capture, verification, and inspection of materials transparent to the near infrared (NIR) / Shortwave Infrared (SWIR) wavelengths.


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ProductsMicroscopyinfraredtabletopautomated3Dwafer inspectionmeasurementsubsurfaceimageMEMSphotovoltaicNIRnear infraredSWIRshortwave infrared

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