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GigE Industrial Beam Profiler

Photonics Showcase
Sep 2018
Ophir, PhotonicsRequest Info
 
GigE Industrial Beam ProfilerThe Ophir® SP920G GigE Silicon CCD beam profiling camera accurately captures and analyzes wavelengths from 190 to 1100 nm. Features include high-speed GigE interface, compact design, wide dynamic range, and unparalleled signal-to-noise ratio for measuring CW and pulsed lasers in industrial applications. 1624- × 1224-pixel resolution, 4.4-µm pixel pitch. Includes BeamGage® advanced beam analysis software.


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