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GigE Industrial Beam Profiler

Ophir, PhotonicsRequest Info
 
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Photonics West 2019 Booth: 927

GigE Industrial Beam ProfilerThe Ophir® SP920G GigE Silicon CCD beam profiling camera accurately captures and analyzes wavelengths from 190nm - 1100nm. Features high–speed GigE interface, compact design, wide dynamic range, and unparalleled signal-to-noise ratio for measuring CW and pulsed lasers in industrial applications. 1624 × 1224 pixel resolution, 4.4µm pixel pitch. Includes BeamGage® advanced beam analysis software.

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