Search Menu
Photonics Media Photonics Marketplace Photonics Spectra BioPhotonics EuroPhotonics Vision Spectra Photonics Showcase Photonics ProdSpec Photonics Handbook

HXC20NIR and HXC40NIR Cameras

Baumer Ltd.Request Info
Facebook Twitter LinkedIn Email Comments
SOUTHINGTON, Conn., Nov. 1, 2011 — For fast and efficient automated optical inspection of solar wafers, Baumer Ltd. USA has introduced its HXC20NIR and HXC40NIR CMOS cameras, which measure electroluminescence and deliver high sensitivity in the near-infrared spectrum.

The company says that the cameras are twice as sensitive as monochrome technology at a wavelength of 900 nm, using electroluminescence to effectively detect fractures and failures in the crystal structure of the solar wafer. The images produced yield information on the integrity and effectiveness of each wafer prior to the next processing step. Structural defects within the wafer can be easily detected, enabling better quality control.

The HXC40NIR model offers 2048 × 2048-pixel resolution with a 1:1 aspect ratio. The high resolution means that fewer cameras can be used to inspect complete modules, simplifying and reducing the cost of inspection. Good image quality with low readout noise is ensured by the global shutter sensor with correlated double sampling developed by CMOSIS.

The HXC20NIR produces 2048 × 1018-pixel resolution.

The cameras support several image formats with up to 12 bits per pixel and are equipped with a flexible Camera Link interface that permits high frame rates in base (three taps) and full (10 taps) modes. The robust, industrial design makes them reliable, and an optimized thermal concept enables their use in an expanded temperature range.
Nov 2011

* Message:
(requirements, questions for supplier)
Your contact information
* First Name:
* Last Name:
* Email Address:
* Company:
Address 2:
Postal Code:
* Country:
Phone #:
Fax #:

Register or login to auto-populate this form:
Login Register
* Required

When you click "Send Request", we will record and send your personal contact information to Baumer Ltd. by email so they may respond directly. You also agree that Photonics Media may contact you with information related to this inquiry, and that you have read and accept our Privacy Policy and Terms and Conditions of Use.
AmericasBaumercamera inspect solar waferscamerascameras base Camera Linkcameras Camera Link interfacecameras CMOSIS global shutter sensorcameras correlated double samplingcameras full Camera Linkcameras global shuttercameras measure electroluminescencecameras sensor CDSCMOSConnecticutenergygreen photonicsHXC20NIR CMOS cameraHXC40NIR CMOS cameraimagingindustrialnear-infrared camerasProductsSensors & DetectorsTest & Measurement

view all
back to top
Facebook Twitter Instagram LinkedIn YouTube RSS
©2021 Photonics Media, 100 West St., Pittsfield, MA, 01201 USA, [email protected]

Photonics Media, Laurin Publishing
x We deliver – right to your inbox. Subscribe FREE to our newsletters.
We use cookies to improve user experience and analyze our website traffic as stated in our Privacy Policy. By using this website, you agree to the use of cookies unless you have disabled them.