Search
Menu
PI Physik Instrumente - Revolution In Photonics Align LW LB 3/24

High-Power Test Meter

Keithley Instruments Inc.Request Info
 
Facebook X LinkedIn Email
Keithley Instruments Inc. has designed its high-power Model 2651A System SourceMeter for characterizing high-power electronics.

The instrument provides the widest current range available in the industry, according to the company. This is critical for a variety of R&D, reliability and production test applications, including the testing of high-brightness LEDs, power semiconductors, DC-DC converters, batteries and other high-power materials, components, modules and subassemblies.

As with each member of the Series 2600A family, Model 2651A offers a flexible, four-quadrant voltage and current source/load coupled with precision voltage and current meters. It combines the functionality of multiple instruments in a single full-rack enclosure: semiconductor characterization, precision power supply, true current source, DMM, arbitrary waveform generator, V or I pulse generator, electronic load and trigger controller.

It also is fully expandable into a multichannel, tightly synchronized system via the company’s TSP-Link technology, and it can source or sink up to 2000 W of pulsed power (±40 V, ±50 A) or 200 W of DC power (±10 V at ±20 A; ±20 V at ±10 A; ±40 V at ±5 A). It also can make precise measurements of signals as low as 1 pA and 100 μV at speeds up to 1 µs per reading.

The device provides a choice of digitizing or integrating measurement modes for precise characterization of both transient and steady-state behavior. Two independent analog-to-digital (A/D) converters define each mode — one for current and the other for voltage — which run simultaneously for accurate source readback without sacrificing test throughput.

The digitizing measurement mode’s 18-bit A/D converters allow capturing of up to 1 million readings per second for continuous 1 μs/point sampling, making this mode the most appropriate choice for waveform capture and for measuring transient characteristics with high precision. Competing solutions must average multiple readings to produce a measurement result and often don’t allow the measurement of transient behavior.

The integrating measurement mode, based on 22-bit A/D converters, optimizes the instrument’s operation for applications that demand the highest possible measurement accuracy and resolution. This ensures precise measurements of the very low currents and voltages common in next-generation devices.

Connecting two Model 2651A units in parallel via TSP-Link expands the system’s current range from 50 to 100 A. The voltage range can be expanded from 40 to 80 V when two units are connected in series. The embedded Test Script Processor simplifies testing by allowing users to address multiple units as a single instrument. A built-in trigger controller synchronizes the operation of all linked channels to within 500 ns.

To minimize device self-heating during tests, a common problem with high-power semiconductors and materials, the instrument offers high-speed pulsing capabilities that allow users to source and measure pulses with high accuracy. Pulse widths from 100 ms to DC and duty cycles from 1 to 100 percent are programmable.


Published: April 2011
REQUEST INFO ABOUT THIS PRODUCT
* First Name:
* Last Name:
* Email Address:
* Company:
* Country:
Message:


When you click "Send Request", we will record and send your personal contact information to Keithley Instruments Inc. by email so they may respond directly. You also agree that Photonics Media may contact you with information related to this inquiry, and that you have read and accept our Privacy Policy and Terms and Conditions of Use.

Register or login to auto-populate this form:
Login Register
* Required

Americascurrent metersdigitizing measurementsintegrating measurementsKeithley Instruments Inc.Model 2651AOhioProductssemiconductorsSystem SourceMeterTest & MeasurementTSP-Linkvoltage metersLEDs

We use cookies to improve user experience and analyze our website traffic as stated in our Privacy Policy. By using this website, you agree to the use of cookies unless you have disabled them.