Imaging Spectrometers

CHELMSFORD, Mass., Oct. 31, 2017 —

Imaging spectrometers from McPherson Inc. measure vertical spatial profiles in addition to dispersed wavelengths.

The devices operate in the vacuum UV range to view plasma impurity emission lines from 300 to 3200 Å and feature a carefully adjusted horizontal aperture in the optical path. The 3-m model provides simultaneous wavelengths measured in a single discharge. With an entrance slit width of 0.02 mm, users can achieve 15.3 pm spectral resolution full width at half maximum. The vertical observation range can be tailored to different heights with a convex mirror, enabling edge profile measurement and full profile measurements that cover an entire vertical size of the plasma.

The new spectrometers can be built for high- or ultra-high vacuum. They can be equipped with microchannel plate intensifiers or sensitive CCD detectors.

Visit company website

About this supplier

explore related content

Photonics.com
Oct 2017

REQUEST INFO ABOUT THIS PRODUCT

* Message:

(requirements, questions for supplier)

Your contact information

* First Name:

* Last Name:

* Email Address:

* Company:

Address:

Address 2:

City:

State/Province:

Postal Code:

* Country:

Phone #:

Fax #:

Register or login to auto-populate this form:

Login Register

* Required

When you click "Send Request", we will record and send your personal contact information to McPHERSON by email so they may respond directly. You also agree that Photonics Media may contact you with information related to this inquiry, and that you have read and accept our Privacy Policy and Terms and Conditions of Use.

Browse Cameras & Imaging, Lasers, Optical Components, Test & Measurement, and more.

Menu

Search

Imaging Spectrometers