InSight WLI with 300-mm Handler

Bruker Nano SurfacesRequest Info
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InSight WLI with 300-mm HandlerThe fully automated InSight WLI system offers unmatched optical surface measurement capabilities with wafer-handler integration. Designed from the ground up for the most demanding R&D, quality assurance, and process quality control needs, the InSight WLI incorporates Bruker’s patented tip/tilt head, a proprietary self-calibrating laser reference, integrated pattern recognition, and a host of other Bruker-exclusive interferometry innovations.

Published: August 2021
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