Industrial X-Ray Inspection System
ZEISS Industrial Quality SolutionsRequest Info
OMNIA GC 220-180 from ZEISS is a 2D x-ray inspection system developed for the automotive industry. The system delivers an inspection volume up to 2200 × 1800 × 900 mm and cycle times of 3-3.5 s per view. The Cartesian axis kinematics, the double tilting of the x-ray source and detector <±45°, and the combination with a variable focus detector distance of both the x-ray source and flat panel detector, allow the inspection of hard-to-reach component areas. The system uses ADR software, FARIS, with integrated ASTM evaluation and classification for image optimization and defect simulation.
https://www.zeiss.de/messtechnik
/Buyers-Guide/ZEISS-Industrial-Quality-Solutions/c24905
Published: July 2025
From the Photonics Marketplace
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