Industrial Laser Monitoring System
DataRay Inc.Request Info
SPIE Photonics West 2023 Booth: 3150
The ILMS is designed for profiling focused, high-power industrial lasers and combines reimaging/magnification optics, a beam sampler, and a beam profiler to measure small beam waists which would otherwise damage a traditional profiling system. Magnification of the focused beam allows measurement of beam spots as small as a few microns, and the software automatically accounts for the magnification of the system, so results do not require post processing or corrections. Visit us at booth #3150.
https://www.dataray.com
/Buyers_Guide/DataRay_Inc/c3455
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