Inspection System

NanotronicsRequest Info
Facebook X LinkedIn Email
SAN FRANCISCO, July 19, 2016 — Inspection System Nanotronics offers the nSpec 2.0, a comprehensive inspection system for fabrication plants and laboratories. The system features advanced machine learning and image processing algorithms that analyze fully patterned wafers and large devices.

The device can locate and classify any feature or defect, from subnanometer through millimeters and centimeters, in materials that are transparent, semitransparent and opaque, and at every stage of production.

Published: July 2016
* First Name:
* Last Name:
* Email Address:
* Company:
* Country:

When you click "Send Request", we will record and send your personal contact information to Nanotronics by email so they may respond directly. You also agree that Photonics Media may contact you with information related to this inquiry, and that you have read and accept our Privacy Policy and Terms and Conditions of Use.

Register or login to auto-populate this form:
Login Register
* Required

ProductsAmericasSan FranciscoCalifornianspec 2.0NanotronicsImaginginspectionindustrialmachine visionAIimage processingMaterialsmaterials processingartificial intelligence

We use cookies to improve user experience and analyze our website traffic as stated in our Privacy Policy. By using this website, you agree to the use of cookies unless you have disabled them.