LD8900 Goniometric Radiometers

MKS Ophir, Light & MeasurementRequest Info
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LOGAN, Utah, Oct. 4, 2011 — Ophir Photonics Group’s patented LD8900 goniometric radiometer performs holographic materials measurement and can make X-Y and 3-D measurements without moving either the detector or the source. This allows the far-field profiler to characterize and confirm the divergence of light passing through holographic materials, such as those used for computer display screens, smartphones and instrument panels. The 3-D capability makes it possible to measure radially symmetrical divergences and angularly different types, addressing a wide range of finished materials.

Measuring diffusion materials is a challenging application that requires testing the consistency of divergence angles across large sheets. The LD8900 line of goniometric radiometers provides full 3-D measurements of the far-field pattern in <2 min, with better resolution than that produced by a CCD camera, according to the company.

The company's line of far-field profilers includes the LD8900 and LD8900R. The LD8900 has a dynamic range of >24 dB and the LD8900R, >36dB, providing greater detail in the “tails” of the far-field pattern. The LDR8900R also provides real-time measurements of mode field diameter in single-mode optical fibers. The angular field of view is 144°, with a resolution of 0.055°.

Besides measuring diffusion materials, the LD8900 can be used to measure laser diodes at any stage in their manufacture, from wafer to packaged product, and to optimize gradient index lenses.

Published: October 2011
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3-D measurement far-field patternsAmericasenergyfar-field profilerholographic materials measurementLD8900 goniometric radiometerLD8900R goniometric radiometermeasure diffusion materialsmeasure laser diodesmeasure radially symmetrical divergencesOphiroptimize gradient index lensesProductsreal-time measurement mode field diameter single-mode optical fibersSensors & DetectorsTest & MeasurementUtah

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