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Zaber Technologies - Nucleus Modular Microscopy Platform LB 1/26

LEXT™ OLS5500 3D Optical Profiler

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LEXT™ OLS5500 3D Optical Profiler Surface data you can trust. The new award-winning LEXT OLS5500 optical profilometer combines laser scanning, white light interferometric, and focus variation microscopy in one powerful platform. Built for R&D, QA, and QC, it delivers precise surface detail, traceable accuracy, and streamlined workflows for confident results. Generate true-to-form surface data from nanometers to millimeters and flat to steep slopes, all in a single system.


Published: December 2025




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