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LEXT OLS4100 3D Laser Scanning Microscope

Olympus Europa SE & Co. KGRequest Info
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HAMBURG, Germany, June 3, 2013 — Olympus Europa’s new LEXT OLS4100 3-D laser scanning microscope analyzes a wide range of sample sizes and features a wide-field area map display of the sample under low magnification, making it suited for applications in optical metrology.

A single image can be constructed from many individual captures, which can then be viewed and measured in either 2-D or 3-D. The boundaries of the stitching area can be automatically detected, or the exact area can be manually specified by tracing around a sample of any shape.

By automatically adjusting for the Z-axis position, the Smart Scan mode restricts image acquisition to the focal plane for rapid scanning in high-resolution 3-D across large areas. Ultrafast mode is about nine times faster than Fine mode, and for even faster targeted acquisition of a specified area, the Band Scan mode will scan only the user-specified region instead of the whole sample.

Imaging through a variety of layers is possible with the new multilayer mode, which recognizes each separate layer as a distinct focal plane along the Z-axis.
Jun 2013

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Band Scan modeEuropeFine modeGermanyimaginglaser scanning microscopeLEXT OLS4100 3DmetrologyMicroscopyMulti-Layer modeOlympusoptical metrologyopticsProductsSmart Scan modeTest & Measurementultrafast mode

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