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Large-Angle EDS for STEMs

JEOL USA Inc.Request Info
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PEABODY, Mass., July 12, 2011 — JEOL USA Inc. has developed an energy-dispersive spectrometer (EDS) for ultrafast, ultrasensitive collection of x-rays through analysis with its scanning transmission electron microscopes (STEMs).

The Centurio is a silicon drift detector energy-dispersive spectrometer that collects x-rays from samples at a large solid angle of up to 0.98 steradians from a detection area of 100 mm2. The larger the solid angle of measurement, the more data the EDS collects to construct detailed analytical maps of the elements in the sample.

With the ability to efficiently collect x-rays at very high count rates, Centurio speeds elemental mapping and improves element detection sensitivity without loss of energy resolution. According to the company, large pixel number EDS maps can be made at rates 10 times faster than with previous EDS designs, with a good signal-to-noise ratio. Combined with the large probe currents in small probe sizes attainable with aberration-corrected STEMs, fast, efficient atomic resolution EDS analysis is possible.

The automatically retractable side entry design allows fast repositioning to avoid irradiation from backscattered electrons.

The instruments exponentially expand the elemental mapping capability for the company’s 200-kV-and-higher transmission electron microscopes, including the JEM-ARM200F atomic resolution TEM with an optional cold field emission gun, and the new JEM-2800 automated high-throughput, nano-area analysis TEM.
Jul 2011

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Americasatomic resolutionBasic ScienceBiophotonicsCenturioEDselement detection sensitivityelemental mappingenergy dispersiveJEOLlarge angleMassachusettsMicroscopyProductsscanning transmission electron microscopeSensors & Detectorsside entrysilicon drift detectorSpectrometerspectroscopySTEMsTest & Measurementx-rays

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