Line Scan SWIR InGaAs Detectors
Xenics NVRequest Info
LEUVEN, Belgium, Feb. 7, 2018 — 
The XLIN-FC series of line scan SWIR indium gallium arsenide (InGaAs) detectors from Xenics NV are suitable for applications in machine vision and spectroscopy.
Using flip-chip (FC)-type hybridization, two detector types are offered: the XLIN-FC R with rectangular pixels for spectroscopy applications and the XLIN-FC SQ with square pixels for machine vision inspection applications. The detectors operate in low-illumination conditions due to a new high-sensitivity read-out integrated circuit developed in-house. The InGaAs photodetectors also exhibit a high quantum efficiency in the 900- to 1700-nm wavelength range.
The detectors come in resolutions of 512, 1024 or 2048 pixels. Fast in-line inspection is guaranteed with a line rate of up to 400 kHz for all three resolutions. Five gain settings are available to optimize performance in a specific application. In highest gain mode, a low read noise of 70 electrons can be achieved. The high dynamic range mode is characterized by a maximum signal-to-noise range of >3000.
https://www.exosens.com
/Buyers_Guide/Xenics_NV/c16191
Published: February 2018
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