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Linescan SWIR InGaAs Detectors

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LEUVEN, Germany, June 29, 2017 — Linescan SWIR InGaAs Detectors The XLIN-FC series of linescan SWIR InGaAs detectors from Xenics NV use flip-chip type hybridization.

The XLIN-FC R is designed with rectangular pixels for spectroscopy applications. It features a 12.5-μm pixel pitch and height. The total array length does not exceed 25.6 mm. The XLIN-FC SQ is designed with square pixels for machine vision applications. It features a pixel pitch of 12.5 μm, and a pixel height for 250 μm.

The detectors operate in low-illumination conditions due to a high-sensitivity read-out integrated circuit. The InGaAs photodetectors also exhibit a high quantum efficiency in the 900- to 1700-nm wavelength range. The detectors feature resolutions of 512, 1024 or 2048 pixels. Fast in-line inspection is guaranteed with a line rate of up to 400 kHz for all three resolutions.

The XLIN-FC SQ detectors are suitable for applications such as food sorting, waste recycling, remote sensing and crack detection in solar cell wafers or ingots. The XLIN-FC R is suitable for SWIR spectroscopy applications, especially medical optical coherence tomography systems.


Photonics.com
Jun 2017
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ProductsXLIN-FCLinescan SWIR InGaAs DetectorsXenicsEuropeindustrialSensors & Detectors

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