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Applied Scientific Instrumentation - Crisp LB 11-22

Lorentz Contact Resonance Imaging

Anasys Instruments Corp.Request Info
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SANTA BARBARA, Calif., May 6, 2013 — Anasys Instruments has expanded its nanoscale materials characterization techniques with the addition of the Lorentz Contact Resonance (LCR) imaging mode for its afm+ and nanoIR systems.

The method provides nanomechanical spectroscopy and compositional mapping on high levels of resolution, including analysis of wide-band contact resonance spectra. It can differentiate between domains in polymer blends and provide insight into materials components in heterogeneous polymer blends.

Based on the proprietary Thermalever probes method, a pole piece is used to focus a magnetic field onto the end of the probe, and an oscillating current is passed through the probe. The interaction between the magnetic and electric fields causes a perpendicular force in the cantilever that results in an oscillating behavior.

There are no moving parts in the drive system, which results in clean cantilever resonance spectra with no parasitic peaks. Using the company’s Analysis Studio software, frequency sweeps from 1 kHz to 4 MHz can be made. Materials with different stiffness will display different amplitudes or shifted peaks at the resonant frequencies of the cantilever.
May 2013

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afm+ systemAmericasAnalysis Studio softwareAnasys InstrumentsBiophotonicsCaliforniacompositional mappingimagingLCRLorentz Contact ResonancenanoIR systemnanomechanical spectroscopynanoscale materials characterizationProductsThermalever probe

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