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LumiMap Electroluminescence System

Bruker Nano SurfacesRequest Info
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TUCSON, Ariz., Sept. 8, 2013 — Bruker Corp. has introduced the LumiMap electroluminescence system for optical and electrical characterization on epitaxial (epi) growth wafers for high-brightness (HB) LEDs.

An alternative to conventional indium dot methods of epi wafer characterization, the system features nondestructive measurement requiring no chemical cleaning afterward; software-controlled measurement locations; and repeatable optical and electrical measurement capabilities through forming a temporary LED device on an epi wafer. The results correlated with those on the final HB-LED, providing an early warning of process shifts, which in turn reduces scrap.
Sep 2013

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AmericasArizonaBrukerelectrical characterizationepitaxial growth wafersgreen photonicshigh brightness LEDindium dot characterizationindustriallight sourcesLumiMap electroluminescence systemNew Productsoptical characterizationopticsProductsTest & MeasurementWafersLEDs

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