Search
Menu
Bristol Instruments, Inc. - 872 Series High-Res 4/24 LB
PROMOTED
CONTENT
Promoted content

MVTec HALCON 23.11. Now Available

MVTec Software GmbHRequest Info
 
Facebook X LinkedIn Email
MVTec Software GmbH - MVTec HALCON 23.11. Now AvailableThe new Version 23.11 of the standard machine software HALCON by MVTec Software GmbH is available since November 14. For the first time, it is possible to license MVTec HALCON cloud environments without a hardware dongle. Apart from several new features, existing technologies have been further improved.

Machine Vision in the Cloud
The fact that HALCON can now be operated fully digitally in the cloud creates numerous new application possibilities. These can be setting up new business models, such as offering machine vision services in the cloud, training deep learning models in a computationally intensive way, or enabling cloud-based CI/CD processes.

MVTec License Server Cloud Ready
With HALCON 23.11, customers have an additional "cloud-ready" variant of the license server at their disposal. This now makes it possible to license HALCON in the environments of commercial cloud providers as well as in enterprise-owned cloud setups. By using HALCON in the cloud, customers can easily benefit from the new possibilities offered by machine vision in the cloud.

Structured Light 3D Reconstruction
In HALCON 23.11, the structured light model has been enhanced: besides deflectometry, it now also provides precise 3D reconstruction for diffuse surfaces in short cycle times. This enhancement gives users the flexibility to develop their own application-specific 3D reconstruction systems. The technology is suitable for the optimization of manufacturing processes, quality control, and the precise measurement of various surfaces.

Multi-Label Classification
In the new HALCON version, customers now have access to "multi-label classification", a new deep learning method that allows the recognition of multiple different classes on a single image. This method can, for instance, reveal the presence of different types of defects in an image, allowing a more detailed classification. Compared to other methods, this deep learning method is faster in processing and the effort for labeling is also lower.


REQUEST INFO ABOUT THIS PRODUCT
* First Name:
* Last Name:
* Email Address:
* Company:
* Country:
Message:


When you click "Send Request", we will record and send your personal contact information to MVTec Software GmbH by email so they may respond directly. You also agree that Photonics Media may contact you with information related to this inquiry, and that you have read and accept our Privacy Policy and Terms and Conditions of Use.

Register or login to auto-populate this form:
Login Register
* Required

Productsmachine visiondeep learningcloudclassificationdigitaloptimizationmanufacturingquality controlmeasurementdeflectometryVision Spectra

We use cookies to improve user experience and analyze our website traffic as stated in our Privacy Policy. By using this website, you agree to the use of cookies unless you have disabled them.