Search
Menu
Gentec Electro-Optics Inc   - Measure With Gentec Accuracy LB
PROMOTED
CONTENT
Promoted content

MadAFM sample scanning AFM

Mad City Labs Inc.Request Info
 
Facebook X LinkedIn Email
Mad City Labs Inc. - MadAFM™ sample scanning AFM The MadAFM is a new multimodal sample scanning AFM. Simple to install with compact tabletop design. Includes Mad City Labs picometer precision nanopositioning systems to give outstanding AFM performance. User-friendly AFMView® software features automated calibration and initialization. MadAFM is compatible with MountainsSPIP® and Gwyddion analysis software.


REQUEST INFO ABOUT THIS PRODUCT
* First Name:
* Last Name:
* Email Address:
* Company:
* Country:
Message:


When you click "Send Request", we will record and send your personal contact information to Mad City Labs Inc. by email so they may respond directly. You also agree that Photonics Media may contact you with information related to this inquiry, and that you have read and accept our Privacy Policy and Terms and Conditions of Use.

Register or login to auto-populate this form:
Login Register
* Required

ProductsAFMatomic force microscopyscanning probe microscopyMaterialsmetrologycharacterizationphysicssurface scienceforce microscopyMicroscopy

We use cookies to improve user experience and analyze our website traffic as stated in our Privacy Policy. By using this website, you agree to the use of cookies unless you have disabled them.