Metrology Instrument
Mahr Inc.Request Info
PROVIDENCE, R.I., Feb. 28, 2020 — 
The AVT 300 M metrology instrument from Mahr Inc. is designed for radius of curvature and tool offset measurements in single-point diamond-turning applications.
The AVT 300 M utilizes a 40-mm aperture Fizeau interferometer in conjunction with a motorized, 300-mm, vertical stage to allow for automated measurements of spherical or flat components. The solution allows for measurements of RoC and tool offset with an accuracy of <0.5 and <0.3 µm, respectively.
https://marketing.mahr.com/maropto
https://www.photonics.com/Buyers_Guide/Mahr_Inc/c8984
Photonics.com
Feb 2020
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