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Metrology Systems

Photonics Spectra
Sep 2009
Lehighton Electronics Inc.Request Info
Lehighton.jpgLehighton Electronics Inc. has enhanced its 1800 series devices for characterizing solar cells, flat panel displays, wafers up to 450 mm in diameter and coated glass panels. The systems are suitable for in-line integration into the manufacturing of solar products, semiconductors, architectural and automotive glass, microwave food susceptors and plastic substrate products. Sensor heads are used for in-line monitoring, and automated conveyor models monitor the uniformity of indium tin oxide, transparent conductive oxide, thin films and other coatings on nonconductive substrates. Optional statistical process control software provides a warning when uniformity or sheet-resistance measurements are out of the desired range.


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1800 seriescharacterizing solar cellscoated glass panelscoatingsConsumerenergyflat panel displaysimagingin-line monitoringindustrialITOLehighton Electronicsmetrology systemsNew Productsoptional softwareSensors & DetectorsTCOthin filmsuniformity monitoringWafers

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