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Correlative Imaging

JEOL USA Inc.Request Info
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The Nikon ECLIPSE LV-N series optical microscope and the JEOL JSM-7000 series field emission scanning electron microscope work concurrently, allowing researchers to observe detailed structures at higher magnifications and to compare them to the optical image on the screen.

The integrated devices from MiXcroscopy enables seamless, rapid observation and navigation of the same region on a sample. It features the same specimen holder for optical microscopy and scanning electron microscopy, and the specimen stage registration is fully controlled by Nikon’s dedicated Elements software.

Aug 2014

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