Search Menu
Photonics Media Photonics Buyers' Guide Photonics Spectra BioPhotonics EuroPhotonics Vision Spectra Photonics Showcase Photonics ProdSpec Photonics Handbook
More News

Microscope Software

Olympus Europa SE & Co. KGRequest Info
Facebook Twitter LinkedIn Email Comments
An updated version of the LEXT OLS4000 confocal laser scanning microscope software has been released by Olympus Europa Holding GmbH.

Compatible with Windows 7, 64-bit operation, version 2.2 allows users to capture high-resolution images up to 10 times faster than the previous version. The new 3-D multilayer function can measure transparent layers, enabling measurement and analysis of multiple layers within a single sample. Users can obtain 3-D images to assess surface metrology.

The software facilitates noncontact measurement of surface roughness, maintaining sample integrity while obtaining the dimensions of microgeometries.

The multilayer mode enables users to recognize the peaks of reflected light intensities on multiple layers within a sample. They can observe and measure the upper surface of a transparent specimen, and measure the thickness of each layer. The shape and roughness of a layer sitting below transparent material, such as a metal surface sitting under a resin layer, can be measured.

Dec 2012

* Message:
(requirements, questions for supplier)
Your contact information
* First Name:
* Last Name:
* Email Address:
* Company:
Address 2:
Postal Code:
* Country:
Phone #:
Fax #:

Register or login to auto-populate this form:
Login Register
* Required

When you click "Send Request", we will record and send your personal contact information to Olympus Europa SE & Co. KG by email so they may respond directly. You also agree that Photonics Media may contact you with information related to this inquiry, and that you have read and accept our Privacy Policy and Terms and Conditions of Use.
3-D images3-D multilayer function64-bit operationBiophotonicsconfocal laser scanning microscope softwareEuropeGermanyLEXT OLS4000 Version 2.2measure transparent layersmetrologymicrogeometriesMicroscopynoncontact measurementOlympusopticsProduct PreviewProductsSoftwaresurface metrologysurface roughnessWindows 7

back to top
Facebook Twitter Instagram LinkedIn YouTube RSS
©2020 Photonics Media, 100 West St., Pittsfield, MA, 01201 USA,

Photonics Media, Laurin Publishing
x Subscribe to EuroPhotonics magazine - FREE!
Are you interested in this product?
When you click "Send Request", we will send the contact details you supply to Olympus Europa SE & Co. KG so they may respond to your inquiry directly.

Email Address:
Stop showing me this for the remainder of my visit
We use cookies to improve user experience and analyze our website traffic as stated in our Privacy Policy. By using this website, you agree to the use of cookies unless you have disabled them.