Search
Menu

Microscopy Compatibility

WITec GmbHRequest Info
 
Facebook X LinkedIn Email
ULM, Germany, May 11, 2016 — Microscopy CompatibilityWitec GmbH has announced the compatibility of its Rise Microscopy Mode with the Zeiss MERLIN scanning electron microscope.

The hybrid system was developed to bring together Raman spectroscopic imaging and advanced ultrastructural analysis. The sample stage is placed within the microscope’s vacuum chamber, where the sample can remain for both measurements, easily transferred between the Raman and microscope measuring positions by a software-driven, push-button mechanism using an extremely precise scan stage.

The combined system provides all functions and features of a standalone Zeiss scanning electron microscope and a Witec confocal Raman microscope.



Published: May 2016
REQUEST INFO ABOUT THIS PRODUCT
* First Name:
* Last Name:
* Email Address:
* Company:
* Country:
Message:


When you click "Send Request", we will record and send your personal contact information to WITec GmbH by email so they may respond directly. You also agree that Photonics Media may contact you with information related to this inquiry, and that you have read and accept our Privacy Policy and Terms and Conditions of Use.

Register or login to auto-populate this form:
Login Register
* Required

ProductsRise Microscopy ModeMicroscopy CompatibilityWITecEuropeImagingSEMRaman spectroscopyinspectionconfocal microscopyMicroscopyZeissMerlin

We use cookies to improve user experience and analyze our website traffic as stated in our Privacy Policy. By using this website, you agree to the use of cookies unless you have disabled them.