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MicrospectrometerThe 20/30 XL Microspectrometer from CRAIC Technologies Inc. is designed to nondestructively analyze microscopic features of large flat panel displays by incorporating large scale sample handling.

With a spectral range from the deep UV to the NIR, sample analysis can be done by absorbance, reflectance, Raman, luminescence, and fluorescence with high speed and accuracy. It integrates Lightblades spectrophotometers with UV-VIS-NIR-range microscope optics. The system can also be configured to image microscopic samples in the UV and NIR regions, in addition to high-resolution color imaging. Its flexible design enables numerous applications with the mapping color and intensity variations, film thickness measurements, and surface defect scanning of display components.

With the ability to analyze spectra and to image microscopic features of very large devices, the 20/30 XL microspectrophotometer is a micro-analysis tool for laboratories and manufacturing facilities.

Published: December 2020
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