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Optical PV Cell Testing System
SAN DIMAS, Calif., Nov. 10, 2009 – Craic Technologies has announced the QDI 2010 PV, a microspectrophotometer designed to measure the transmission and reflectance of photovoltaic cells whether traditional crystalline silicon, the thin-film variety or components such as super- and substrates. Protective glass and concentrator modules also can be analyzed.

CRAIC_QDI.jpgThe UV/VIS/NIR system enables the user to determine thin-film thickness of microscopic sampling areas on both transparent and opaque substrates. It can be combined with proprietary contamination imaging capabilities to locate and identify process contaminants.

The microspectrophotometer combines advanced microspectroscopy with sophisticated software to enable the user to measure transmissivity, reflectivity and luminescence. It can determine the thin-film thickness by either transmission or reflectance of many types of materials and substrates and can measure the transmissivity and reflectivity from many of the components used to manufacture photovoltaic cells.

Transmission, absorbance, reflectance, polarization, emission and fluorescence spectra of samples ranging from >100 µm to <1 µm across can be measured. While microspectra are being acquired, the sample can be viewed simultaneously with a high-resolution digital imaging system or through eyepieces with the DirecVu package and research-grade optics.

Designed for the production environment, the instrument performs nondestructive measurements and incorporates a number of easily modified metrology recipes, the ability to measure new films and materials as well as sophisticated tools for analyzing data.

The integrated thermoelectrically cooled array detector ensures low noise and long-term stability. Optional hardware includes automation and specialized analysis packages, and optional software includes specialized data analysis, databasing and imaging.

For more information, visit:  

Craic Technologies
948 North Amelia Ave.
San Dimas, CA 91773
Phone: (310) 573-8180
Fax: (310) 573-8182
Nov 2009

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