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MonoCL4

Photonics.com
Sep 2009
Gatan Inc.Request Info
 
Photonic Characterization Tool
PLEASANTON, Calif., Sept. 18, 2009 – Gatan Inc. has launched the MonoCL4, a photonic characterization tool that performs spectroscopic analysis with high spatial resolution and depth of field based upon the power and flexibility of an electron probe.

As a next-generation cathodoluminescence (CL) system, it is used in high-resolution CL imaging, spectroscopy and spectrum imaging.

Gatan-MonoCL4.jpgCL is suitable for a wide range of specimens including microcharacterization of the optical and electronic properties of semiconductor and optoelectronic materials, and observation of parts-per-million changes in mineral chemistry. The tool’s sensitivity allows the use of low injection conditions for high CL spatial resolution and makes it suitable for investigating restricted volume specimens such as thin films, nanowires, quantum dots and transmission electron microscope specimens.

The collection, dispersion and detection efficiency has extended the use of CL and enabled new applications including observation of luminescent labels in the life sciences and of surface plasmons on metallic nanostructures, and the screening of active pharmaceutical ingredients.

Features include enhanced sensitivity in the UV and IR wavelengths; “point and click” selection of spectroscopy, imaging and mapping modes; short-pass, long-pass and bandpass imaging using filter options for increased flexibility; and new software features, including an option for spectrum-imaging with a large field of view.

The MonoCL4 family of products provides a range of high-performance CL solutions that are individually engineered to meet specific microscopy needs. The modular structure provides convenient and cost-effective upgrade paths to the premium packages and also allows users to extend the usable wavelength range with additional detectors.

The new system is compatible with conventional, low-vacuum and field-emission scanning electron microscopes (SEMs), combined focused ion beam/SEMs and ion microscopes. Special versions are available for microprobes, transmission electron microscopes (TEMs)/scanning TEMs and UHV chambers, and all are fully compatible with the company’s range of cryogenic stages and SmartEBIC systems.

For more information, visit: www.gatan.com  

Gatan Inc.
5794 W. Las Positas Blvd.
Pleasanton, CA 94588
Phone: (925) 463-0200
Fax: (925) 463-0204


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