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NanoWizard Ultra Speed AFM

JPK Instruments AGRequest Info
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BERLIN, Dec. 12, 2013 — JPK Instruments AG’s next-generation NanoWizard Ultra Speed AFM (atomic force microscope) delivers fast scanning and superresolution on an inverted microscope for applications including the study of biological or other soft-matter systems.

The device provides real-time tracking changes in samples imaged in air or liquid. Its low-noise scanner, position sensor and detection system enable line-rate scanning speeds >100 Hz in closed-loop mode, while a proprietary Quantitative Imaging mode provides quantitative material property mapping.

A tip-scanning design and proprietary DirectOverlay mode allow the system to be fully integrated with an inverted optical microscope. Measurements can be made on single molecules or on living cells.
Dec 2013

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AFMatomic force microscopyBiophotonicsEuropeGermanyimaginginverted microscopeJPK Instrumentslive cell imagingMicroscopyNanoWizard atomic force microscopeNanoWizard Ultra Speed AFMopticsProductsQuantitative ImagingsuperresolutionTest & Measurement

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