OPC Analyzer

Fractilia LLCRequest Info
Facebook X LinkedIn Email
AUSTIN, Texas, June 25, 2024 — Fractilia OPC AnalyzerThe FAME OPC from Fractilia is an optical proximity correction (OPC) measurement and analysis tool that can be used in semiconductor chip manufacturing. Available as a stand-alone product or as an add-on, the analyzer measures and subtracts random and systematic errors from SEM images to provide measurements of what is on the wafer rather than what is on the images. The FAME OPC measures all major stochastic effects simultaneously, including LER, LWR, LCDU, LEPE, and stochastic defects, as well as providing CD and other distance measurements.

Published: June 2024
* First Name:
* Last Name:
* Email Address:
* Company:
* Country:

When you click "Send Request", we will record and send your personal contact information to Fractilia LLC by email so they may respond directly. You also agree that Photonics Media may contact you with information related to this inquiry, and that you have read and accept our Privacy Policy and Terms and Conditions of Use.

Register or login to auto-populate this form:
Login Register
* Required

ProductsTest & MeasurementmetrologySensors & DetectorsSoftwareSEM imagesWaferssemiconductorsindustrialAmericasFractilia

We use cookies to improve user experience and analyze our website traffic as stated in our Privacy Policy. By using this website, you agree to the use of cookies unless you have disabled them.