Optical Inspection Module
Cohu Inc.
The Infra-Red Automated Optical Inspection (AOI) module from Cohu Inc. is designed for enhanced microcrack and subsurface defect detection on wafer-level chip-scale packages.
The device integrates IR imaging onto a high-speed automation platform that delivers an economical solution for high-quality inspection. IR imaging has the ability to see through silicon, inspecting the structure underneath the surface that is not otherwise observable with traditional vision inspection systems.
Applications include use in semiconductor inspection, IoT, mobility, and automotive fields.
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Published: August 2018